ZHANG, W. D.; LI, B.; WANG, W. W.; WANG, X. Y.; CHENG, Y.; JIANG, A. Q. Ultrahigh Dielectric Permittivity of a Micron-Sized Hf0.5Zr0.5O2 Thin-Film Capacitor After Missing of a Mixed Tetragonal Phase. Nano-Micro Letters, [S. l.], v. 18, p. 6, 2025. DOI: 10.1007/s40820-025-01841-x. Disponível em: https://www.nmlett.org/index.php/nml/article/view/2131. Acesso em: 22 jul. 2025.