ZHOU, Z.; REN, Y.; YU, F.; MA, J. Electron Redistribution by Fluorine-Induced Dual Defects in Cu3P Accelerated Charge Transfer Toward High-Performance Electrochemical Chloride Ion Removal. Nano-Micro Letters, [S. l.], v. 18, p. 412, 2026. DOI: 10.1007/s40820-026-02267-9. Disponível em: https://www.nmlett.org/index.php/nml/article/view/2558. Acesso em: 29 jun. 2026.