DENG, C.; YOU, S.; ZHONG, H.; ZENG, X.; HAO, X.; XIE, J.; ZHOU, Z.; JIN, Z.; YE, H.; XU, L.; WU, J.; DONG, P.; LI, W.; JIAO, X.; YANG, W. Aligning Out-of-Plane Polarization in 2D Ferroelectric Perovskite Wafer Boosts Interlayer Carrier Transport for Efficient X-Ray Detection. Nano-Micro Letters, [S. l.], v. 19, p. 54, 2026. DOI: 10.1007/s40820-026-02352-z. Disponível em: https://www.nmlett.org/index.php/nml/article/view/2655. Acesso em: 23 oct. 2026.