Jana D, Samanta S, Roy S, Lin YF, Maikap S. Observation of Resistive Switching Memory by Reducing Device Size in a New Cr/CrO x /TiO x /TiN Structure. Nano-Micro Lett [Internet]. 2015Aug.1 [cited 2024Apr.26];7(4):392-9. Available from: https://www.nmlett.org/index.php/nml/article/view/425