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Vol. 19 (2027)

Aligning Out-of-Plane Polarization in 2D Ferroelectric Perovskite Wafer Boosts Interlayer Carrier Transport for Efficient X-Ray Detection

https://doi.org/10.1007/s40820-026-02352-z
Chenhao Deng
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China
Shihai You
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China
Haiqing Zhong
State Key Laboratory of Functional Crystals and Devices, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, People’s Republic of China
Xiankan Zeng
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China
Xiaolong Hao
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China
Jiasheng Xie
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China
Zheng Zhou
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China
Zhangjian Jin
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China
Huang Ye
State Key Laboratory of Functional Crystals and Devices, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, People’s Republic of China
Lijun Xu
State Key Laboratory of Functional Crystals and Devices, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, People’s Republic of China
Jianbo Wu
Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR 999077, People’s Republic of China
Panpan Dong
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China
Wen Li
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China
Xingxing Jiao
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China
Weiqing Yang
Key Laboratory of Advanced Technologies of Materials (Ministry of Education), School of Materials Science and Engineering, Research Institute of Frontier Science, Southwest Jiaotong University, Chengdu 610031, People’s Republic of China

Corresponding Author: Weiqing Yang

wqyang@swjtu.edu.cn

Nano-Micro Letters, Vol. 19 (2027), Article Number: 54

Abstract

2D metal halide perovskites (MHPs) featuring suppressed ion migration and enhanced structural stability are highly promising for direct X-ray detection but suffer from poor interlayer carrier transport and difficulty in scaling single crystals. Here, we overcome these limitations by fabricating high-quality, centimeter-sized polycrystalline wafers of a 2D ferroelectric MHP with out-of-plane spontaneous polarization, (Mpda)PbBr4 (Mpda = N-methyl-1,3-propanediamine), via a facile hot-pressing strategy. This process induces a horizontal orientation of microcrystals, resulting in vertical alignment of their polar axes and thus macroscopic polarization in the wafer. Such an intriguing polarization generates a switchable built-in electric field that can promote separation and interlayer transport of photogenerated carriers, exhibiting a bulk photovoltage of up to 2 V. Consequently, the vertical X-ray detector can not only be operated in self-powered mode but also achieve a high sensitivity of 2285 μC Gy−1 cm−2 and an ultralow detection limit of 7.2 nGy s−1 under a small bias (16 V). The device also exhibits remarkable operational stability and high-resolution X-ray imaging capability. This work demonstrates that aligning the intrinsic ferroelectric polarization in polycrystalline wafers is a viable strategy to enhance vertical carrier transport, paving the way toward high-performance, flat-panel X-ray detectors based on 2D MHPs.


Hightlights:
1 High-quality, centimeter-sized polycrystalline wafers of a 2D ferroelectric perovskite are fabricated via a facile hot-pressing method, circumventing the challenge of growing large, thick single crystals of 2D perovskites.
2 The preferred horizontal orientation of grains, combined with electric poling, creates macroscopic out-of-plane polarization, generating a strong built-in electric field that boosts interlayer carrier transport.
3 The poled wafer not only enables self-powered X-ray detection but also achieves a high sensitivity (2285 μC Gy−1 cm−2) and an ultralow detection limit (7.2 nGy s−1) under a small bias, along with exceptional operational stability and high-contrast X-ray imaging.

Keywords

2D perovskite X-ray detection Polycrystalline wafer Hot-pressing Out-of-plane polarization
Deng, Chenhao, Shihai You, Haiqing Zhong, Xiankan Zeng, Xiaolong Hao, Jiasheng Xie, Zheng Zhou, Zhangjian Jin, Huang Ye, Lijun Xu, Jianbo Wu, Panpan Dong, Wen Li, Xingxing Jiao, and Weiqing Yang. 2026. “Aligning Out-of-Plane Polarization in 2D Ferroelectric Perovskite Wafer Boosts Interlayer Carrier Transport for Efficient X-Ray Detection”. Nano-Micro Letters 19 (October):54. https://doi.org/10.1007/s40820-026-02352-z.
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